statistical data analysis , Process Mapping, Fmea, Spc, Doe, 8D, Msa, Capa

Pi, yield analysis, wafer-level statistics, Spc, Pe, Npi, Manufacturing Engineering

Dmaic, Process Validation, Risk Assessment, Quality Systems, MPO fiber arrays, composite packaged optical components, Doe, Process Simulation, Problem-solving

Semiconductor Manufacturing, 8D problem solving process, DRAM operation, HBM products

Statistical Analysis, GIT revision control, mixed signal test techniques, data analysis tools, Advantest V93K, Teradyne UltraFLEX, ATE test development, mixed signal ATE, Cohu DiamondX, electronic devices and circuits, hardware and PCB design tools