optical-mechanical systems, systems design support, defect review, root-cause analysis, engineering builds, field qualification, customer pilot deployments, NPI activities, advanced packaging, Microscopy, system sub-system integration test and characterization, Optics, wafer inspection, beta installations, semiconductor manufacturing processes, performance validation, sensor technology, Process Control, technical investigation, lithography, Metrology, optoelectronics, Diagnostics

Java, Scripting Language, Python, ATE test program, Computer, MBIST, test system hardware, Failure Diagnosis Isolation tools, Electrical, CPU architecture fundamentals, Physics, CMOS device physics, ISO 26262 Functional Safety, ATPG, Automotive high-reliability product lifecycles, ATE testing, DFT methodology, AEC-Q100 qualification, Automotive Semiconductor Quality Standards, DFT insertion techniques, Scan, JMP related data analytic tools, LBIST, post-silicon characterization