Excel, AOI, Python, Spc, process integration qualification, wafer-level process, 8D, Cp, Problem-solving, Jmp, Rca, Minitab, Process Control, wafer sort, CPK

semiconductor equipment, Process Management, digital fluency, AI literacy, AI-assisted tools

Quality Assurance, Cpk Control Plans, PCB A Manufacturing Processes, Fmea, Spc, DPPM, Defect Density, 8D CAPA, Failure Analysis, System-Level Test Workflows, Supplier Audits, Root-Cause Investigations, Inspection Processes, Continuous Improvement Projects, Statistical Process Control

6 sigma methodology, SPC data analysis