Non-contact characterization methods, Optical interferometry, Metrology data analytics

Artificial Intelligence (AI), Atomic Force Microscopy (AFM), White Light Interferometry (WLI), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Machine Learning (ML), Metrology defect detection, Metrology data analytics, Semiconductor electrical or non-contact characterization methods

Software Engineering, Artificial Intelligence, Machine Learning, Ml, Data Science, AI Engineering, Ai, Generative AI, GenAI, Agentic AI, AI Agents, LLMs, Large Language Models, AI Skills, AI Harnesses, MCP, Model Context Protocol, AI Frameworks, Open Source AI Libraries, AI Applications, AI Products, AI Solutions, AI/ML Applications

data engineering , ML Libraries (scikit-learn), Version Control (Git), PyTorch), Containerization (Docker), Deep Learning Frameworks (TensorFlow, Data Processing (pandas, Orchestration (Kubernetes), NumPy), Java, Spring Boot, Python, Machine Learning, Distributed Systems, Artificial Intelligence, Restful Services, Agentic AI, Microservices Architecture, API Design Principles, Event-driven Architectures