Image Processing, Computer Vision, sensor characterization, semiconductor inspection, electron beam systems, Optics, precision optical electronic systems, signal data analysis, electron gun HV design, charged particle dynamics theory, Metrology

python, Scripting Language, Java, Computer, MBIST, test system hardware, Electrical, Failure Diagnosis Isolation tools, Physics, cmos device physics, ATPG, ATE testing, DFT methodology, DFT insertion techniques, data analytic tools, Scan, IOBIST, ATE test program