Spi, I2c, Pcie, semiconductor device reliability testing methods, semiconductor design, investigating component failures, high-speed design, control interfaces, Fabrication, quality reliability failure analysis, ASICs, characterization, field returns, Qualification Testing, hardware designs, FPGAs, LU, semiconductor components, HTOL, ARM CPUs, retimers, NPI mass production, ELFR, Esd, MDIO, PHYs, XPUs, SERDES

Spi, Pcie, I2c, ARM CPUs, hardware designs, Fabrication, HTOL, retimers, LU, semiconductor design, FPGAs, semiconductor components, ASICs, Qualification Testing, ELFR, SERDES, Esd, quality reliability failure analysis, PHYs, high-speed design, characterization, MDIO, XPUs