Statistical Analysis, Spi, Pcie, I2c, Computer Engineering, Physics, Memory, eSPI, Peripheral characterization, Root-cause analysis, Electrical Engineering, CXL, Data Collection, I3C

silicon photonics , Technical Documentation, CMOS Foundry, Manufacturing Requirements, Foundry Interactions, Optical Routing, Risk Management, Process Flows, Component Integration, Yield Improvement, Wafer Fabrication, process integration