Ethernet Switches, Spi, I2c, NPUs, Fabrication, HTOL, hardware designs with x86 or ARM CPUs, retimers, LU, semiconductor device reliability testing methods, semiconductor design, FPGAs, ASICs, Qualification Testing, CPUs, ELFR, Esd, quality reliability failure analysis, PHYs, high-speed design, characterization, MDIO, control interfaces such as PCIe

Spi, I2c, Pcie, semiconductor device reliability testing methods, semiconductor design, investigating component failures, high-speed design, control interfaces, Fabrication, quality reliability failure analysis, ASICs, characterization, field returns, Qualification Testing, hardware designs, FPGAs, LU, semiconductor components, HTOL, ARM CPUs, retimers, NPI mass production, ELFR, Esd, MDIO, PHYs, XPUs, SERDES