statistical data analysis , process monitoring methodologies, process development, Spc, FDC, 8D, plasma etching fundamentals, Root Cause Analysis, dry etch processes, silicon etch, Dmaic, process troubleshooting, APC, oxide etch, profile control, Doe, process control systems, process characterization

Data Analytics, Python, Reliability Testing, inline metrology, AI ML tools, advanced packaging technologies, 3D stacking, DFT data analysis, R, HBM, hybrid bonding, Statistical Modeling, defect inspection systems, 2.5D

Chemistry, Thermodynamics, films and interface engineering, mass transport, chemical kinetics, Ftir, data analysis systems, EDX, sims, TEM, Sem, Xps