Spi, Pcie, I2c, control interfaces, hardware designs, HTOL, retimers, LU, semiconductor device reliability testing methods, semiconductor design, Qualification Testing, ASICs, semiconductor components, NPI mass production, ELFR, SERDES, Esd, PHYs, MDIO, XPUs, ARM CPUs, Fabrication, FPGAs, quality reliability failure analysis, high-speed design, characterization, investigating component failures, field returns

Spi, Pcie, I2c, ARM CPUs, hardware designs, Fabrication, HTOL, LU, retimers, semiconductor design, FPGAs, ASICs, semiconductor components, Qualification Testing, ELFR, SERDES, PHYs, quality reliability failure analysis, Esd, high-speed design, characterization, MDIO, XPUs