statistical data analysis , process monitoring methodologies, process development, Spc, FDC, 8D, plasma etching fundamentals, Root Cause Analysis, dry etch processes, silicon etch, Dmaic, process troubleshooting, APC, oxide etch, profile control, Doe, process control systems, process characterization

Wet etch processes, Mass transport, Chemistry, Films and interface engineering, Chemical kinetics, Data analysis systems, Memory processing, Ftir, sims, EDX, Y3, TEM, Xps, Sem, Thermodynamics

films and interface engineering, mass transport, TEM, data analysis systems, Xps, Sem, sims, Thermodynamics, EDX, Chemistry, Ftir, chemical kinetics