Process Optimization, contamination control, Fmea, Spc, Failure Analysis, data-driven monitoring, 8D, project management

Visual Basic, C, Python, Analog and digital semiconductor circuits, Data Analysis, Battery charging IPs, Bluetooth radio architectures, Analog and digital audio PMU

Chemcad, Statistical Process Control, PFDs, 8D methodology, Troubleshooting, Process Design, scale-up, Root Cause Analysis, liquid and solids handling equipment

C, Test Engineering, Slt, Python, yield analysis, Data Analysis, compute platforms, post-silicon validation, silicon test processes, Ate, Failure Analysis, semiconductor manufacturing methodologies, AI ML models, core software development, silicon development, Embedded Systems, AI processors, fault isolation techniques, silicon yield optimization, statistical methods, Product Engineering

SAP, 5-Why, ISO 9001 Quality Management System, Root Cause Analysis, 8D

analog circuits , automation, mixed-signal designs, Jmp, optical components, Data Analysis, RF Testing, optical lab equipment

Iso27001, Problem Solving, ISO22301, Iso9001, Root Cause Analysis, Continuous Improvement, Supplier Performance Metrics, VDA6.3 Audit Experience, IATF16949, Supplier Quality Management

ni labview , statistical process control methods, NSD, Data Analysis, RF test, Accretech probers, Linearity, NI TestStand, EVM, 200mm and 300mm prober operation