fab metrology tools, cvd, materials characterization, NAND cell structures, ald, device physics, vacuum systems, electrical test methods, plasma processes, chemical reactions

Data Analytics, microstructural properties, target manufacturing processes, HIP bonding, material characterization, sputtering target materials, Casting

plasmonics , optical modeling tools, comsol, waveguide optics, Lumerical, RSoft, integrated optical component design, device physics, FDTD

Bom, materials characterization, mechanical assessment, Product Development, Continuous Improvement, cross functional integration, Control Plans, prototype build, engineering documentation, Root Cause Analysis, defect catalog