statistical data analysis , Advantest 93k ATE platform, Teradyne UltraFlex J750, Exensio platform

Statistical Analysis, Failure Analysis, Reliability Testing, Teradyne UltraFlex, mass production yield improvement, Advantest 93K, test data analysis, semiconductor test program development, test hardware design and verification, Credence D10 DX

quality procedures , Automated Test Equipment, ATE Test Programming principles, Semiconductor Manufacturing Test Processes, Hardware design knowledge of LB Probe Card, Process Control, Statistical methods, Data analysis tools, Debug skills, RF ATE Techniques, Advantest 93K, Diamond X, Cohu Unison platform, Diamond 10