Statistical Analysis, Data Visualization, Test Methodologies, Failure Analysis, Teradyne UltraFlex, mass production yield improvement, Advantest 93K, test data analysis, semiconductor test program development, test hardware design and verification, Credence D10 DX, test data analysis tools, reliability test support, test flows, product characterization, corner analysis, semiconductor automatic test equipment

Field Application Engineering (FAE), Optical component inspection, IC packaging testing, Semiconductor test program development, Financial Compliance